4

A re-examination of the interstitial Ti levels in Si

Year:
2012
Language:
english
File:
PDF, 248 KB
english, 2012
6

Platinum‐Copper Defects in Silicon

Year:
2019
Language:
english
File:
PDF, 869 KB
english, 2019
12

Defects in Oxidized p ‐type Si Wafers Observed by Surface Photovoltage Spectroscopy

Year:
2019
Language:
english
File:
PDF, 1.59 MB
english, 2019